
Electrical Specifications
MC68HC08AZ32A Data Sheet, Rev. 2
296
Freescale Semiconductor
20.12 RAM Memory Characteristics
20.13 EEPROM Memory Characteristics
Characteristic
Symbol
Min
Max
Unit
RAM data retention voltage
VRDR
0.7
—
V
Characteristic
Symbol
Min
Typ
Max
Unit
EEPROM programming time per byte
tEEPGM
10
—
ms
EEPROM erasing time per byte
tEEBYTE
10
—
ms
EEPROM erasing time per block
tEEBLOCK
10
—
ms
EEPROM erasing time per bulk
tEEBULK
10
—
ms
EEPROM programming voltage discharge period
tEEFPV
100
—
s
Number of programming operations to the same
EEPROM byte before erase(1)
1. Programming a byte more times than the specified maximum may affect the data integrity of that byte. The byte must be
erased before it can be programmed again.
———
8
—
EEPROM programming maximum time to AUTO bit set
—
500
s
EEPROM erasing maximum time to AUTO bit set
—
8
ms
EEPROM endurance(2)
2. Typical endurance was evaluated for this product family. For additional information on how Freescale defines Typical En-
durance, please refer to Engineering Bulletin EB619.
—10K
>100K
—
Cycles
EEPROM data retention(3)
3. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please
refer to Engineering Bulletin EB618.
—
15
>100
—
Years