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參數(shù)資料
| 型號： | LT3464DICE |
| 廠商： | LINEAR TECHNOLOGY CORP |
| 元件分類： | 穩(wěn)壓器 |
| 英文描述： | 0.14 A SWITCHING REGULATOR, UUC8 |
| 封裝： | DIE-8 |
| 文件頁數(shù)： | 2/2頁 |
| 文件大?。?/td> | 58K |
| 代理商： | LT3464DICE |
DICE/DWF SPECIFICATION
LT3464
2
PARAMETER
CONDITIONS
MIN
MAX
UNITS
Minimum Input Voltage
2.3
V
Quiescent Current
Not Switching
36
A
VSHDN = 0.2V
0.5
A
FB Comparator Trip Voltage
VFB Falling, VCTRL = 3.6V
1.215
1.275
V
FB Pin Bias Current
VFB = 1.25V, VCTRL = 3.6V
30
nA
FB Voltage Line Regulation
2.3V < VIN < 10V
0.1
%/V
Switch Leakage Current
VSW = 36V
1
A
Switch Current Limit
85
140
mA
Schottky Reverse Leakage
VCAP-SW = 36V
10
A
PNP Disconnect Q Current
IOUT = 0, VCAP = 36V (Note 3)
5
A
PNP Disconnect Leakage
SHDN = 0.2, VCAP = 10V, VOUT = 0V
5
A
PNP Disconnect Current Limit
VCAP = 10V, VOUT = 0V
25
75
mA
SHDN Pin Current
VSHDN = 3.6V
10
A
SHDN Input Voltage High
2.3
V
SHDN Input Voltage Low
0.2
V
CTRL Pin Bias Current
VCTRL = 0.5V, VFB = 1V
80
nA
CTRL to FB Offset
VCTRL = 0.5V (Note 3)
7
mV
DICE ELECTRICAL TEST LI ITS
W
LINEAR TECHNOLOGY CORPORATION 2005
Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus
packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on
dice performance and lot qualifications via lot sampling test procedures.
Dice data sheet subject to change. Please consult factory for current revision in production.
I.D.No. 66-13-3464
Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
(408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com
LT/LT 0405 PRINTED IN USA
TA = 25°C. VIN = 3.6V, unless otherwise noted.
Note 1: Absolute Maximum Ratings are those values beyond which the life
of a device may be impaired.
Note 2: Current consumed by Disconnect PNP when there is no load on
the OUT pin.
Note 3: This figure is computed according to ((VFB falling + VFB rising)/2)
–VCONTROL.
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